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*EXTENDED DEFECTS IN AMORPHIZED AND RAPID THERMALLY ANNEALED SILICON

Author(s):
Maher, D.M.
Knoell, R.V.
Ellington, M.B.
Hull, R.
Jacobson, D.C.
Joy, D.C.
1 more
Publication title:
Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
52
Pub. Year:
1985
Page(from):
93
Page(to):
106
Pages:
14
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837173 [0931837170]
Language:
English
Call no.:
M23500/52
Type:
Conference Proceedings

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