DIRECT MEASUREMENT OF THE SUBSURFACE HYDROGEN BARRIER LAYER IN PLASMA-TREATED SILICON RIBBON
- Author(s):
- Publication title:
- Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 46
- Pub. Year:
- 1985
- Page(from):
- 561
- Page(to):
- 566
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837111 [0931837111]
- Language:
- English
- Call no.:
- M23500/46
- Type:
- Conference Proceedings
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