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HIGH RESOLUTION OPTICAL STUDY OF THE ANTISITE DEFECT AsGa IN GaAs, CORRELATION WITH MIDGAP LEVEL EL2

Author(s):
Skowronski, M.
Lin, D. G.
Lagowski, J.
Pawlowicz, L..M.
Ko, K. Y.
Gatos, H. C.
1 more
Publication title:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
46
Pub. date:
1985
Page(from):
207
Page(to):
212
Pages:
6
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837111 [0931837111]
Language:
English
Call no.:
M23500/46
Type:
Conference Proceedings

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