HIGH-VOLTAGE ELECTRON MICROSCOPY INVESTIGATION OF SUBGRAIN BOUNDARIES IN RECRYSTALLIZED SILICON-ON-INSULATOR STRUCTURES
- Author(s):
- Publication title:
- Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 35
- Pub. Year:
- 1985
- Page(from):
- 593
- Page(to):
- 598
- Pages:
- 6
- Pub. info.:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837005 [0931837006]
- Language:
- English
- Call no.:
- M23500/35
- Type:
- Conference Proceedings
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