Blank Cover Image

Quantitation of secondary ion mass spectrometry (SIMS) for HgCdTe

Author(s):
Publication title:
Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
25
Pub. Year:
1984
Page(from):
657
Page(to):
662
Pages:
6
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444009050 [0444009051]
Language:
English
Call no.:
M23500/25
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Ion Implantation and Secondary Ion Mass Spectrometry of Compound Semiconductors

Wilson, R G.

Electrochemical Society
7 Conference Proceedings Characterization of Gate Dielectric Layers with Secondary Ion Mass Spectrometry (SIMS)

Erickson, J.W., Brock, R., Killian, A., Johnston, G., Trotter, D., Nouri, F.

Electrochemical Society
2 Conference Proceedings High-Precision Characterization of III-Nitride Semiconductor Alloys with Secondary Ion Mass Spectrometry (SIMS)

Erickson, J. W., Gao, Y., Wilson, R. G.

MRS - Materials Research Society
8 Conference Proceedings THE CHARACTERIZATION OF INTENTIONAL DEPANTS IN HgCdTe USING SIMS, HALL-EFFECT, AND C-V MEASUREMENTS

Lapides, L. E., Whitney, R. L., Crosson, C. A.

Materials Research Society
3 Conference Proceedings Static secondary ion mass spectrometry characterization of nail polish and paint surfaces

Gresham,G.L., Groenewold,G.S., Bauer,W.F., Ingram,J.C., Avci,R.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Advances in Characterization of III-Nitrides by Secondary Ion Mass Spectrometry

Lierde, P. V., Tian, C., Hockett, R.A., Wei, L., Hockett, D.S., Alejandro, P.C., Keller, S., DenBaars, S.P.

Electrochemical Society
4 Conference Proceedings Molecular Secondary Ion Mass Spectrometry

Pachuta, Steven J., Cooks, R. Graham

American Chemical Society
10 Conference Proceedings Negative Secondary Ion Mass Spectrometry of Gold Surfaces

Boldach G., Main E. D., Standing G. K., Westmore B. J.

Plenum Press
5 Conference Proceedings The Use of Secondary Ion Mass Spectrometry to Investigate Wire Bonding Yield Problems on Gold Contacts

Mount, G. R., Walzak, T. L., Koo, Y. C., McClure, D.

MRS - Materials Research Society
11 Conference Proceedings (676h) Fluorinated Nanoparticle Immunolabels for Imaging Specific Membrane Proteins in Parallel with Cell Membrane Lipids Using High-Resolution Secondary Ion …

Mary L. Kraft, Robert L. Wilson, Jessica F. Frisz, Kevin J. Carpenter, Peter K. Weber

American Institute of Chemical Engineers
6 Conference Proceedings INVESTIGATION OF TITANIUM SILICIDE FORMATION USING SECONDARY ION MASS SPECTROMETRY

Wee, A. T. S., Huan, A. C. H., Thian, W. H., Tan, K. L., Hogan, R.

MRS - Materials Research Society
12 Conference Proceedings Analysis of implanted boron profiles across the Si-Si02 interface by secondary ion mass spectrometry

Deline, V. R., Johnson, N. M., Christel, L. A.

North-Holland
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12