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THE EFFECT OF OXYGEN IN COSPUTTERED (TITANIUM + SILICON ) FILMS

Author(s):
  • Beyers, R.
  • Sinclair, R. ( Department of Materials Science and Engineering Stanford University, Stanford,. CA; )
  • Thomas, M. E. ( Fairchild Camera and Instrument Corporation, Palo Alto, CA )
Publication title:
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
14
Pub. Year:
1983
Page(from):
423
Page(to):
428
Pages:
6
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008121 [0444008128]
Language:
English
Call no.:
M23500/14
Type:
Conference Proceedings

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