Blank Cover Image

OXYGEN PRECIPITATION IN SILICON - ITS EFFECTS ON MINORITY CARRIER RECOMBINATION AND GENERATION LIFETIME

Author(s):
Publication title:
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
14
Pub. date:
1983
Page(from):
187
Page(to):
194
Pages:
8
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008121 [0444008128]
Language:
English
Call no.:
M23500/14
Type:
Conference Proceedings

Similar Items:

Chan, S.S., Varker, C. J., Whitfield, J., Carpenter, R. W.

Materials Research Society

Borionetti, G., Porrini, M., Geranzani, P., Orizio, R., Falster, R.

Electrochemical Society

Cornish, J. C. L., Subaer, Jennings, P., Hefter, G. T.

MRS - Materials Research Society

Vanhellemont, J., Kaniava, A., Libezny, M., Simoen, E., Kissinger, G., Gaubas, E., Claeys, C., Clauws, P.

MRS - Materials Research Society

Kempf, A., Bloechl, P., Huber, A.

Electrochemical Society

Porrini, M., Gambaro, D., Geranzani, P., Falster, R.

Electrochemical Society

Lee, B.-Y., Park, B.-M., Hwang, D.-H., Kwon, O-J.

Electrochemical Society

Babu,Sunanda, Subramanian,V., Rao,Y.Syamasundara, Sobhanadri,J.

SPIE-The International Society for Optical Engineering, Narosa

Ulyashin, A., Simoen, E., Camel, L., De Wolf, S., Dekkers, H., Rafi, J.M., Beaucarne, G., Poortmans, J., Claeys, C.

Electrochemical Society

Lavine, J.P., Hawkins, G.A., Anagnostopoulos C.N., Rivaud L.

Materials Research Society

Sewell, R., Dell, J.M., Musca, C.A., Faraone, L.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12