Blank Cover Image

*PRECIPITATION OF OXYGEN AND THE MECHANISH OF STACKING FAULT FORMATION IN CZOCHRALSKI SILICON BULK CRYSTALS,

Author(s):
Publication title:
Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
14
Pub. Year:
1983
Page(from):
125
Page(to):
140
Pages:
16
Pub. info.:
New York: North-Holland
ISSN:
02729172
ISBN:
9780444008121 [0444008128]
Language:
English
Call no.:
M23500/14
Type:
Conference Proceedings

Similar Items:

Shen, B., Sekiguchi, T., Chen, P., Yang, K., Chen, Z. Z., Zheng, Y. D., Sumino, K.

MRS - Materials Research Society

Takeno, H., Aihara, K., Hayamizu, Y., Kitagawara, Y.

Electrochemical Society

Tanahashi, K., Inoue, N., Mizokawa, Y.

MRS - Materials Research Society

Nauka, K., Gatos, H. C., Lagowski, J.

North-Holland

Hara, A, Fukuda, T., Hirai, I., Ohsawa, A.

Materials Research Society

Hourai, M., Nagashima, T., Kajita, E., Miki, S., Sumita, S., Sano, M., Shigematsu, T.

Electrochemical Society

K. Sueoka

Electrochemical Society

Jablonski,J., Shen,B., Mchedlidze,T.R., Imai,M., Sumino,K.

Trans Tech Publications

Shaffner, T.J.

Electrochemical Society

Kissinger, G., Morgenstern, G., Grabolla, T., Richter, H., Vanhellemont, J., Lambert, U., Graef, D.

Electrochemical Society

Takeno, H., Aihara, K., Hayamizu, Y., Masui, T., Suezawa, M.

Electrochemical Society

Kim, Y., Ha, T.S., Yoon, J.K.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12