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Single Event Upset Sensitivity of a SRAM: An Overview from Testing Procedures to Device Hardening

Author(s):
Publication title:
Proceedings of the ESA Electronic Components Conference, held at the Conference Centre, ESTEC, Noordwijk, the Netherlands, 12-16 November 1990
Title of ser.:
ESA SP
Ser. no.:
313
Pub. Year:
1991
Page(from):
351
Page(to):
356
Pages:
6
Pub. info.:
Paris: ESA Publications Division
ISSN:
03796566
ISBN:
9789290920946 [9290920947]
Language:
English
Call no.:
E11690/911401
Type:
Conference Proceedings

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