Blank Cover Image

The Influence of the AC Component of the Plasma Potential on the Measurements of the Ion Flux

Author(s):
Publication title:
Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2004-03
Pub. Year:
2004
Page(from):
351
Page(to):
356
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774161 [1566774160]
Language:
English
Call no.:
E23400/200403
Type:
Conference Proceedings

Similar Items:

Swart, L., Verdonck, P.

Electrochemical Society

S.G. Walton, D. Leonhardt, R.F. Fernsler, R.A. Meger

Society of Vacuum Coaters

Swart, L., Verdonck, P., Moshkalyov, S.A.

Electrochemical Society

Swart, P. L., Chtcherbakov, A. A., van Wyk, A. J.

SPIE - The International Society of Optical Engineering

Verdonck, P., Swart, J., Brasseur, G., DeGeyter, P.

Electrochemical Society

van Wyk, A. J., Swart, P. L., van Rooyen, J. A., Chtcherbakov, A. A.

SPIE - The International Society of Optical Engineering

Verdonck, P.

Electrochemical Society

Swart, P. L., van Brakel, A.

SPIE - The International Society of Optical Engineering

Laura Swart, Andre M. Daltrini, Stanislav Moshkolyov, Patrick Verdonck

Electrochemical Society

A.,Chtcherbakov A., L.,Swart P.

CNR

Swart, Pieter L., Macquet,. Bea M., Grobler, Michael F.

Materials Research Society

Mansano, R. D., Mousinho, A. P., Zambom, L. S., de Medeiros, M. S., Verdonck, P., Guerino, M., Massi, M.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12