Low-Frequency Noise in Deep-Submicron MOSFETs

Low-Frequency Noise in Deep-Submicron MOSFETs

Author(s):

Publication title:

Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

2004-03

Pub. Year:

2004

Page(from):

15

Page(to):

20

Pages:

6

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566774161 [1566774160]

Language:

English

Call no.:

E23400/200403

Type:

Conference Proceedings

Details

TDL ID:	ZA00015413
Series ID:	PA00000028
Conf. info. (Name):	SBMICRO ; Symposium on Integrated Circuits and System Design
Conf. info. (Number):	19th (2004) ; 17th
Conf. info. (Venue):	Porto de Galinhas, Brazil
Conf. info. (Date):	2004.09.07-2004.09.11

Similar Items:

1 Conference Proceedings Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs Simoen, E., Mercha, A., Claeys, C. Kluwer Academic Publishers	7 Conference Proceedings SOI Low Frequency Noise and Interface Trap Density Measurements with the Pseudo MOSFET V. A. Kushner, J. Yang, J. Choi, T. Thornton, D. Schroder Electrochemical Society
2 Conference Proceedings Low Frequency Noise in 4H-SiC MOSFETs S.L. Rumyantsev, M.S. Shur, M.E. Levinshtein, P.A. Ivanov, J.W. Palmour Trans Tech Publications	8 Conference Proceedings 4H-SiC MOSFETs with Si-Like Low-Frequency Noise Characteristics S.L. Rumyantsev, M.S. Shur, M.E. Levinshtein, P.A. Ivanov, J.W. Palmour Trans Tech Publications
3 Conference Proceedings High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation Rengel, R., Mateos, J., Pardo, D., Gonzalez, T., Martin, M.J., Dambrine, G., Danneville, F., Raskin, J.-P. SPIE-The International Society for Optical Engineering	9 Conference Proceedings Technique of low-frequency noise versus temperature for identification of deep-level defects in semiconductor materials Cwirko,J., Przybysz,C., Cwirko,R., Kaminski,P. SPIE-The International Society for Optical Engineering
4 Conference Proceedings Low frequency noise sources in fully and partially depleted SOI MOSFETs from room to liquid helium temperatures Jomaah, J, Ghibaudo, G, Balestra, F Electrochemical Society	10 Conference Proceedings Hot-carrier degradation for deep-submicron N-MOSFETs introduced by back-end processing Lie,D.Y.C., Xia,W., Yota,J., Joshi,A.B., Zwingman,R., Williams,R., Kerametlian,V., Cerney,D., Min,B.W., Kwong,D.L. SPIE-The International Society for Optical Engineering
5 Conference Proceedings The Low-Frequency Noise in n-MOSFETs on Strained Silicon: Is There Room for Improvement? Simoen, E., Eneman, G., Verheyen, P., Delhougne, R., Rooyackers, R., Loo, R., Vandervorst, W., De Meyer, K., Claeys, C. Electrochemical Society	11 Conference Proceedings Characterization of SOI MOSFETs at microwave frequencies Gillon, R., Raskin, J.P., Vanhoenacker, D., Colinge, J.P., Dambrine, G. Electrochemical Society
6 Conference Proceedings DC Performance and Low Frequency Noise in n-MOSFETs using Self-Aligned Poly-Si/SiGe Gate H.R. Jimenez Grados, L.T. Manera, R. Cotrin Teixeira, M. Rautemberg, J.A. Diniz Electrochemical Society	12 Conference Proceedings The Cyogenic Operation of Deep Submicron MOSFETs Balestra, F. Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12