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Total-dose radiation hardness of the SOI 4-gate transistor (G4-FET)

Author(s):
Akarvardar, K.
Cristoloveanu, S.
Schrimpf, R.D.
Dufrene, B.
Gentil, P.
Blalock, B.J.
Mojarradi, M.M.
2 more
Publication title:
Silicon-on-insulator technology and devices XII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-03
Pub. date:
2005
Page(from):
99
Page(to):
106
Pages:
8
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774611 [1566774616]
Language:
English
Call no.:
E23400/200503
Type:
Conference Proceedings

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