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Radiation-Induced Deep Levels in Lead- and Tin-Doped n-Type Czochralski Silicon

Author(s):
David, M.-L.
Simoen, E.
Claeys, C.
Neimash, V.
Kras'ko, M.
Kraitchinski, A.
Voytovuch, V.
Tishcenko, V.
Barbot, J.F.
4 more
Publication title:
High purity silicon VIII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2004-05
Pub. Year:
2004
Page(from):
395
Page(to):
406
Pages:
12
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774185 [1566774187]
Language:
English
Call no.:
E23400/200405
Type:
Conference Proceedings

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