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Ge pile-up and defect formation during dry oxidation of SiGe

Author(s):
Daval, N.
Guiot, E.
Bourdelle, K. K.
Kennard, M.
Cayrefourcq, I.
Akatsu, T.
Mazure, C.
Cerva, H.
Rucki, A.
4 more
Publication title:
Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-10
Pub. date:
2005
Page(from):
42
Page(to):
51
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774284 [1566774284]
Language:
English
Call no.:
E23400/200510
Type:
Conference Proceedings

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