Blank Cover Image

Local Anodic Oxidation of Silicon Surfaces Using Atomic Force Microscopy

Author(s):
Publication title:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-08
Pub. Year:
2005
Page(from):
304
Page(to):
310
Pages:
7
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774260 [1566774268]
Language:
English
Call no.:
E23400/200508
Type:
Conference Proceedings

Similar Items:

D.K. Pinto, S.G. Dos Santos Filho

Electrochemical Society

de Souza Fo, J. C., dos Santos Fo., S. G.

Electrochemical Society

Blach, J.A., Watson, G.S., Brown, C.L., Pham, D.K., Wright, J.P., Nicolau, D.V., Myhra, S.

SPIE-The International Society for Optical Engineering

Crozier,K.B., Yaralioglu,G.G., Degertekin,F.L., Adams,J.D., Minne,S.C., Quate,C.F.

SPIE-The International Society for Optical Engineering

Gilicinski, Andrew G., Rynders, Rebecca M., Beck, Scott E., Strausser, Yale E., Stets, James R., Felker, Brian S., …

MRS - Materials Research Society

Singh,Rajendra, Arora,S.K., Kumar,Ravi, Virdi,G.S., Ganesan,V., Avasthi,D.K., Kanjilal,D.

SPIE - The International Society for Optical Engineering

Occelli, M. L., Gould, S. A. C., Stucky, G. D.

Elsevier

Nogueira, W. A., dos Santos Fo., S. G.

Electrochemical Society

J.H. Lee, J.J. Ahn, A. Hallén, C.M. Zetterling, S.M. Koo

Trans Tech Publications

Walters,D.A., Viani,M., Paloczi,G.T., Schaffer,T.E., Cleveland,J.P., Wendman,M.A., Gurley,G., Elings,V., Hansma,P.K.

SPIE-The International Society for Optical Engineering

Wittborn, J., Canalias, C., Rao, K.V., Polushkin, N.I.

Kluwer Academic Publishers

Hashimoto, A. I., Gozzi, O., dos Santos Filho, S. G.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12