Blank Cover Image

Simple Method to Determine the Poly Gate Doping Concentration Based on Poly Depletion Effect

Author(s):
Publication title:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-08
Pub. date:
2005
Page(from):
180
Page(to):
187
Pages:
8
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774260 [1566774268]
Language:
English
Call no.:
E23400/200508
Type:
Conference Proceedings

Similar Items:

M. Rodrigues, V. Sonnenberg, J.A. Martino

Electrochemical Society

Giacomini, R., Martino, J. A.

Electrochemical Society

Wong, H.Y., Takeuchi, H., King, T.-J., Ameen, M., Agarwal, A.

Electrochemical Society

M. Rodrigues, V. Sonnenberg, J. A. Martino

Electrochemical Society

Sonnenberg, V., Martino, J.A.

Electrochemical Society

Sonnenberg, V., Martino, J.A.

Electrochemical Society

M. Galeti, J. A. Martino, E. Simoen, C. Claeys

Electrochemical Society

Sonnenberg, V, Martino, J

Electrochemical Society

L.M. Camillo, J.A. Martino, E. Simoen, C. Claeys

Electrochemical Society

Michele Rodrigues, Victor Sonnenberg, João Antonio Martino

Electrochemical Society

Ye, Q., Limb, Y., Berry, W., Li, Y., Do Thanh, L., Rengarajan, R., Tonti, W.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12