Blank Cover Image

The Low-Frequency Noise in n-MOSFETs on Strained Silicon: Is There Room for Improvement?

Author(s):
Simoen, E.
Eneman, G.
Verheyen, P.
Delhougne, R.
Rooyackers, R.
Loo, R.
Vandervorst, W.
De Meyer, K.
Claeys, C.
4 more
Publication title:
ULSI Process Integration : proceedings of the International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-06
Pub. Year:
2005
Page(from):
349
Page(to):
359
Pages:
11
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774642 [1566774640]
Language:
English
Call no.:
E23400/200506
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings P+/N Junction Formation in Thin Strain Relaxed Buffer Strained Silicon Substrates: The Effect of the Junction Anneal

Eneman, G., Simoen, E., Delhougne, R., Verheyen, P., Simons, V., Loo, R., Caymax, M., De Meyer, K., Vandervorst, W., …

Electrochemical Society
7 Conference Proceedings Impact of the back-gate bias on the low-frequency noise of partially depleted silicon-on-insulator MOSFETs

Lukyanchikova, N. R., Garbar, N., Smolanka, A., Simoen, E., Mercha, A., Claeys, C.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings N+/P and P+/N Junctions in Strained Si on Thin Strain Relaxed SiGe Buffers: the Effect of Defect Density and Layer Structure

Eneman, G., Simoen, E., Delhougne, R., Verheyen, P., Ries, M., Loo, R., Caymax, M., Vandervorst, W., De Meyer, K.

Materials Research Society
8 Conference Proceedings Diode Analysis of Electrically Active Defects in Recessed SiGe Source/Drain Diodes

E.R. Simoen, M.B. Gonzalez, G. Eneman, P. Verheyen, C.L. Claeys

Electrochemical Society
3 Conference Proceedings Defect Engineering Considerations for Strained Silicon Substrates

C. Claeys, G. Eneman, M. Scholz, R. Loo, P. Verheyen, K. De Meyer, E. R. Simoen

Electrochemical Society
9 Conference Proceedings Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs

Simoen, E., Mercha, A., Claeys, C.

Kluwer Academic Publishers
4 Conference Proceedings Analysis of Junctions Formed in Strained Si/SiGe Substrates

Eneman, G., Simoen, E., Lauwers, A., Lindsay, R., Verheyen, P., Delhougne, R., Loo, R., Caymax, M., Meunier-Beillard, …

Materials Research Society
10 Conference Proceedings The Combination of Embedded Si1-xGex S/D and Metal Gate Options for High Performance pMOS Transistors

P. Verheyen, S. Severi, G. Eneman, R. Loo, D. Shamiryan

Electrochemical Society
5 Conference Proceedings (Selective) Epitaxial Growth of Strained Si to Fabricate Low Cost and High Performance CMOS Devices

Loo, R., Delhougne, R., Meunier-Beillard, P., Caymax, M., Verheyen, P., Eneman, G., Wolf, I.De, Janssens, T., Benedetti, …

Materials Research Society
11 Conference Proceedings The Role of Preamorphization and Activation for Ultra Shallow Junction Formation on Strained Si Layers Grown on SiGe Buffer

Pawlak, B.J., Vandervorst, W., Lindsay, R., Wolf, I.De, Roozeboom, F., Delhougne, R., Benedetti, A., Loo, R., Caymax, …

Materials Research Society
6 Conference Proceedings Electrical Activity of Dislocations and Defects in Strained Si and Ge Based Devices

E.R. Simoen, G. Eneman, P. Verheyen, R. Loo, M. Bargallo Gonzalez

Electrochemical Society
12 Conference Proceedings The Role of Preamorphization and Activation for Ultra-Shallow Junction Formation on Strained Si Layers Grown on SiGe Buffer

Pawlak, B.J., Vandervorst, W., Lindsay, R., Wolf, I.De, Roozeboom, F., Delhougne, R., Benedetti, A., Loo, R., Caymax, …

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12