Blank Cover Image

Negative-Bias-Temperature Instability in Si/SiO2 and Si/SiOxNy Structures

Author(s):
Publication title:
Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2005-01
Pub. Year:
2005
Page(from):
327
Page(to):
339
Pages:
13
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774598 [1566774594]
Language:
English
Call no.:
E23400/200501
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The Effect of the Oxide Network Structure on the Irradiation Behavior of SiO2 Films on Silicon

Revesz, A.G., Hughes, H.L.

Electrochemical Society
7 Conference Proceedings Process Dependence of Negative Bias Temperature Instability in PMOSFETS

Prasad, S., Li, E., Duong, L.

Electrochemical Society
2 Conference Proceedings *PROPERTIES OF BURIED SiO2 FILMS IN SIMOX STRUCTURES

Revesz, A.G., Brown, G.A., Hughes, H.L.

Materials Research Society
8 Conference Proceedings Negative Bias Temperature Instability of SiC MOSFET

C.T. Yen, H.T. Hung, C.C. Hung, C.Y. Lee, H.Y. Lee

Trans Tech Publications
3 Conference Proceedings Hydrogen in Buried SiO2 Layers

Revesz, A.G., Stahlbush, R.E., Hughes, H.L.

Electrochemical Society
9 Conference Proceedings Modeling and Characterization of Negative Bias Temperature Instability in p- Channel MOSFETs

J. Yang, T. Chen, S. Tan, C. Ng, L. Chan

Electrochemical Society
4 Conference Proceedings Infrared absorption study of buried oxides of single and triple implanted SIMOX structures

Lisovskii, I P, Revesz, A G, Hughes, H L

Electrochemical Society
10 Conference Proceedings Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability

B. Kaczer, T. Grasser, R. Fernandez, G. Groeseneken

Electrochemical Society
5 Conference Proceedings Negative Bias Temperature Instability on Subthreshold Swing of SiC MOSFET

C.T. Yen, H.T. Hung, C.C. Hung, L.S. Lee, C.Y. Lee, Y.F. Huang, F.J. Hsu, T.L. Chen

Trans Tech Publications
11 Conference Proceedings Hydrogen Model for Negative Bias Temperature Instabilities in MOS Gate Dielectrics

Fleetwood, D.M., Zhou, X.J., Tsetseris, L., Pantelides, S.T., Schrimpf, R.D.

Electrochemical Society
6 Conference Proceedings Negative Bias Temperature Instability in Ultra-Thin SiON

Mitani, Y., Satake, H., Toriumi, A.

Electrochemical Society
12 Conference Proceedings A Study of Negative Bias Temperature Instability (NBTI) in pFETs

S. Zafar, J. Stathis, A. Callegari

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12