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A New Method of Diagnosing Simultaneous Multiple Faults via Neural Networks

Author(s):
  • Lee, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
  • Park, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
  • Himmelblau, D. ( University of Texas at Austin, Austin, TX )
Publication title:
AIChE ANNUAL MEETING - NOVEMBER 16-21, 1997 - LOS ANGELES, CA
Title of ser.:
AIChE meeting [papers]
Ser. no.:
1997
Pub. Year:
1997
Paper no.:
215b
Pages:
26
Pub. info.:
New York: American Institute of Chemical Engineers
Language:
English
Call no.:
A08000
Type:
Conference Proceedings

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