Alfermann W. A., Petersen M., Dombrowski K.
Kluwer Academic Publishers
|
Park, S.-W., Linden, J.C., Vivanco, J.M.
IOS Press
|
Hamill J. D., Parr A. J., Martin C., Walton N. J., Robins R., Rhodes M. J. C.
Springer-Verlag
|
Suflita, J. M., Davidova, I. A., Gieg, L. M., Nanny, M., Prince, R. C.
Elsevier
|
Hirasuna, Thomas J., Willard, Diana M., Shuler, Michael L.
American Institute of Chemical Engineers
|
Chou, Shan-rong, Chin, Chee-Kok
American Chemical Society
|
Newport,C.L., Parker,J., Smith,K.M., Benveniste,A., Kim,N.-W., Reyland,D., Farrow,R.C., Novembre,A.E., Kasica,R.J., …
SPIE - The International Society for Optical Engineering
|
Lake,M.L.
Kluwer Academic Publishers
|
M. Arif Khan, Stephen E. Rankin, John M. Littleton, Barbara L. Knutson
American Institute of Chemical Engineers
|
Chillcce, E.F., Osorio, S.P., Rodriguez, E., Cesar, C.L., Barbosa, L.C.
SPIE - The International Society of Optical Engineering
|
M. Arif Khan, Stephen E. Rankin, John M. Littleton, Barbara L. Knutson
American Institute of Chemical Engineers
|
Haymon, L. Wendell, Acton, James C.
American Chemical Society
|