RECASENS, F., SMITH, J. M., MC COY, B. J.
American Institute of Chemical Engineers
|
Tokarz, M., Jaras, S., Persson, B.
Elsevier
|
Qian, S.Y., Gao, L.J., Conway, B.E., Jerkiewicz, G.
Electrochemical Society
|
Jung, W.G., Kao, B., Kelly, K.M., Ding, Z., Nelson, J.S., Chen, Z.
SPIE-The International Society for Optical Engineering
|
Coy Mc M. B., Wu T. T.
D. Reidel
|
Sun, Y.-M., Lee, S.Y., Engbrecht, E.R., Pfeifer, K., Smith, S., White, J.M., Ekerdt, J.G.
Materials Research Society
|
Siri, G. J., Marchetti, G. S., Ferretti, O. A., Gonzalez, M. G.
Elsevier
|
Tsao,S.-L., Chen,M.C., Ho,J.-M, Ko,M.-T.
SPIE-The International Society for Optical Engineering
|
Ryndin, Yu.A., Candy, J.P., Bergeret, G., Savary, L., Uzio, D., Basset, J.M.
Elsevier
|
Tang, S., Chiang, M.C., Liu, J.M., Vicente, R., Mirasso, C.R.
SPIE - The International Society of Optical Engineering
|
Butt B. J.
Martinus Nijhoff Publishers
|
Fernandez, A.I., Lopez, B., Rodriguez-Ibabe, J.M.
Trans Tech Publications
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