Frunza, L., Kosslick, H., Schoenhals, A., Pitsch, I., Frunza, S.
SPIE-The International Society for Optical Engineering
|
Kosslick, H., Fricke, R., Miessner, H., Hoang, D.L., Storeck, W.
Elsevier
|
Frunza, S., Frunza, L., Schonhals, A., Zubowa, H.-L., Kosslick, H., Fricke, R.
Elsevier
|
Kosslick, H., Landmesser, H., Fricke, R., Storek, W.
Elsevier
|
Zubowa, H. -L., Bentrup, U., Kosslick, H., Fricke, R.
Elsevier
|
Fricke, R., Richter, M., Schreier, E., Eckelt, R., Kosslick, H.
Elsevier
|
Frunza, L., Kosslick, H., Pitsch, I., Frunza, S., Schonhals, A., Krause, C., Stallmach, F., Karger, J.
Elsevier
|
Kosslick, H., Tuan, V. A., Fricke, R., Martin, A., Storek, W.
Elsevier
|
G. Strangi, S. Ferjani, V. Barna, A. D. Luca, C. Versace, N. Scaramuzza, R. Bartolino
SPIE - The International Society of Optical Engineering
|
Kwok,H.-S., Xie,Z.-L., Qian,T.-Z., Sheng,P.
SPIE-The International Society for Optical Engineering
|
Richter, M., Kosslick, H., Fricke, R.
Elsevier
|
Rozanski,S.A., Stannarius,R., Groothues,H., Kremer,F.
SPIE-The International Society for Optical Engineering
|