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Huber, G.W, Guymon, C.G., Conrad, T.L., Stephenson, B.C., Bartholomew, C.H.
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Dikj, H. A. J. van, Hoebink, J. H. B. J., Schouten, J. C.
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Huber, G.W., Bartholomew, C.H.
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Hoebink, J.H.B.J., Schouten, J.C., Dijk, H.A.J. van
American Institute of Chemical Engineers
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Shi, H. -B., Li, Q., Dai, X. -P., Yu, C. -C., Shen, S. -K.
Elsevier
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Jacobs, G., Zhang, Y., Das, T.K., Li, J., Patterson, P.M., Davis, B.
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Gershenson,A., Fischer,C.J., Schauerte,J.A., Steel,D.G., Gafni,A.
SPIE-The International Society for Optical Engineering
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Fiorel, F., Lietti, L., Pederzani, G., Tronconi, E., Zennaro, R., Forzatti, P.
Elsevier
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Schirmer,A., Heitjans,P., Faber,W., Fischer,J.E.
Trans Tech Publications
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Bartle K. D., Louie P. K. K., Bottrell S. H., Taylor N., Marsh H., Thomas K. M.
Kluwer Academic Publishers
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Frost, J. C., Lafyatis, D. S., Rajaram, R. R., Walker, A. P.
Elsevier
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