Yoon, S. B., Kim, J. Y., Ahn, Y. -S., Kim, H. -S., Yu, J. -S.
Elsevier
|
Kuno, M.K., Higginson, K.A., Bonevich, J.E., Qadri, S.B., Yousuf, M., Mattoussi, H.M.
SPIE-The International Society for Optical Engineering
|
Yoon, S. B., Kim, J. Y., Yu, J. -S., Kim, J. -W., Chang, S., Lee, J. G.
Elsevier
|
S.J. Warrender, P.A. Wright, W. Zhou, P. Lightfoot, M.A. Camblor, C.-H. Shin, D.J. Kim, S.B. Hong
Elsevier
|
Sung, I. -K., Kim, T. -S., Yoon, S. -B., Yu, J. -S., Kim, D. -P.
Elsevier
|
Zhu, H.Y., Cool, P., (Max)Lu, G.Q., Vansant, E.F.
Elsevier
|
Chang, J.-S., Kim, D.S., Park, S.-E., Forster, P.M., Cheetham, A.K., Ferey, G.
Elsevier
|
Simon, S. L., Sun, J., Doshi, P., Lahlouh, B., Chen, X., Sangopadhyay, S.
Society of Plastics Engineers
|
Kyoung-Shin Choi, Ellen M. P. Steinmiller, Matthew S. Yarger
Materials Research Society
|
Huachun Li, Shunai Che
Elsevier
|
Cho, I. K., Yoon, K. B, Ahn, S. H., Kim, J. T., Lee, W. J., Shin, K. U., Heo, Y. U., Park, H. H.
SPIE - The International Society of Optical Engineering
|
C. O. Ania, T.J. Bandosz
Elsevier
|