Garcia, R., Coombs, T. D., Maple, M. J., Zhou, W., Shannon, I. J., Cox, P. A., Wright, P. A.
Elsevier
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Frunza, L., Van Der Voort, P., Vansant, E.F., Schonheyd, R.A., Weckhuysen, B.M.
Elsevier
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Ojo, A.F., Fitch, F.R., Bulow, M., Lau, M.-L.
Elsevier
|
Boynton,P.A., Kelley,E.F., Highnote,S.M., Hurtado,R.
SPIE - The International Society for Optical Engineering
|
Popov, V. P., Stas, V. F., Antonova, I. V.
MRS - Materials Research Society
|
Abramski,K.M., Plinski,E.F., Witkowski,J.S., Duda,P.A., Nowicki,R.
SPIE-The International Society for Optical Engineering
|
Cox,P.A.
Kluwer Academic Publishers
|
Fabis, P.M., Borchelt, E.F.
Electrochemical Society
|
Wolf, S. A., Huang, C. Y., Lacoe, R. C., Chaikin, P. M., Fuller, W. W., Luo, H. L., Wudl. F.
North-Holland
|
Boynton, P.A., Kelley, E.F., Libert, J.M.
SPIE-The International Society for Optical Engineering
|
J.C.S. Casini, L.M.C. Zarpelon, E.A. Ferreira, H. Takiishi, R.N. de Faria
Trans Tech Publications
|
Boynton, P.A., Kelley, E.F., Libert, J.M.
SPIE - The International Society of Optical Engineering
|