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Terahertz reflection spectroscopy for explosives detection

Author(s):
Fitch, M. J. ( Johns Hopkins Univ. (USA) )
Dodson, C. ( Johns Hopkins Univ. (USA) )
Chen, Y. ( Rensselaer Polytechnic Institute (USA) )
Liu, H. ( Rensselaer Polytechnic Institute (USA) )
Zhang, X. -C. ( Rensselaer Polytechnic Institute (USA) )
Osiander, R. ( Johns Hopkins Univ. (USA) )
1 more
Publication title:
Terahertz for military and security applications III : 28-29 March 2005, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5790
Pub. Year:
2005
Page(from):
281
Page(to):
288
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457752 [0819457752]
Language:
English
Call no.:
P63600/5790
Type:
Conference Proceedings

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