Terahertz reflection spectroscopy for explosives detection
- Author(s):
Fitch, M. J. ( Johns Hopkins Univ. (USA) ) Dodson, C. ( Johns Hopkins Univ. (USA) ) Chen, Y. ( Rensselaer Polytechnic Institute (USA) ) Liu, H. ( Rensselaer Polytechnic Institute (USA) ) Zhang, X. -C. ( Rensselaer Polytechnic Institute (USA) ) Osiander, R. ( Johns Hopkins Univ. (USA) ) - Publication title:
- Terahertz for military and security applications III : 28-29 March 2005, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5790
- Pub. Year:
- 2005
- Page(from):
- 281
- Page(to):
- 288
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457752 [0819457752]
- Language:
- English
- Call no.:
- P63600/5790
- Type:
- Conference Proceedings
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