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Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width

Author(s):
Publication title:
Fundamental problems of optoelectronics and microelectronics II : 13-16 September, 2004, Khabarovsk, Russia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5851
Pub. date:
2005
Page(from):
190
Page(to):
193
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458483 [0819458481]
Language:
English
Call no.:
P63600/5851
Type:
Conference Proceedings

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