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Phase noise analysis for OFDM systems based on hot-carrier effects in synchronization electronics

Author(s):
Publication title:
Noise in Communication Systems
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5847
Pub. Year:
2005
Page(from):
150
Page(to):
159
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458421 [0819458422]
Language:
English
Call no.:
P63600/5847
Type:
Conference Proceedings

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