Investigation of the trap states and their effect on the low-frequency noise in GaN/AlGaN HFETs
- Author(s):
- Liu, W. L. ( Univ. of California/Riverside (USA) )
- Chen, Y. L. ( Univ. of California/Los Angeles (USA) )
- Balandin, A. A. ( Univ. of California/Riverside (USA) )
- Wang, K. L. ( Univ. of California/Los Angeles (USA) )
- Publication title:
- Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5844
- Pub. Year:
- 2005
- Page(from):
- 268
- Page(to):
- 275
- Pages:
- 8
- Pub. info.:
- Bellingham, Washington: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458391 [0819458392]
- Language:
- English
- Call no.:
- P63600/5844
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
7
Conference Proceedings
Low-frequency Noise in “Graphene-Like” Exfoliated Thin Films of Topological Insulators
Materials Research Society |
Materials Research Society |
8
Conference Proceedings
Reliability modeling of high voltage AlGaN/GaN and GaAs field-effect transistors
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
9
Conference Proceedings
Low-frequency noise in SiO2/AlGaN/GaN heterostructures on SiC and sapphire substrates
MRS-Materials Research Society |
MRS - Materials Research Society |
10
Conference Proceedings
Low Frequency Noise Characterization In AlGaN/GaN HEMTs With Varying Gate Recess Depth
Materials Research Society |
Kluwer Academic Publishers |
11
Conference Proceedings
Comparative Investigation Of Photoluminescence Of Si-And In-Doped Gan/Algan Multiquantum Wells
Materials Research Society |
MRS-Materials Research Society |
SPIE-The International Society for Optical Engineering |