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A combined noise analysis and power supply current based testing of CMOS analog integrated circuits

Author(s):
Publication title:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5844
Pub. Year:
2005
Page(from):
230
Page(to):
237
Pages:
8
Pub. info.:
Bellingham, Washington: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458391 [0819458392]
Language:
English
Call no.:
P63600/5844
Type:
Conference Proceedings

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