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Nano device for monitoring electrical fluctuations on bacterial scale (Invited Paper)

Author(s):
Seo, S. ( Texas A&M Univ. (USA) )
Kim, J. ( Texas A&M Univ. (USA) )
Dobozi-King, M. ( Texas A&M Univ. (USA) )
Young, R. F. ( Texas A&M Univ. (USA) )
Bezrukov, S. M. ( National Institutes of Health (USA) )
Kish, L. B. ( Texas A&M Univ. (USA) )
Cheng, M. ( Texas A&M Univ. (USA) )
2 more
Publication title:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5844
Pub. Year:
2005
Page(from):
158
Page(to):
163
Pages:
6
Pub. info.:
Bellingham, Washington: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458391 [0819458392]
Language:
English
Call no.:
P63600/5844
Type:
Conference Proceedings

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