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Real-time electron counting studies on charge fluctuations in a semiconductor quantum dot (Invited Paper)

Author(s):
Lu, W. ( Harvard Univ. (USA) )  
Publication title:
Fluctuations and noise in materials II : 24-25 May, 2005, Austin, Texas, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5843
Pub. date:
2005
Page(from):
124
Page(to):
140
Pages:
17
Pub. info.:
Bellingham, Washington: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458384 [0819458384]
Language:
English
Call no.:
P63600/5843
Type:
Conference Proceedings

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