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A methodology for the characterization of arithmetic circuits on CMOS deep submicron technologies

Author(s):
Publication title:
VLSI Circuits and Systems II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5837
Pub. date:
2005
Page(from):
902
Page(to):
912
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458322 [0819458325]
Language:
English
Call no.:
P63600/5837-2
Type:
Conference Proceedings

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