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Wavelet analysis of hyperspectral reflectance data for spectral feature extraction

Author(s):
  • Sun, G. ( Anhui Institute of Optics and Fine Mechanics, CAS (China) )
  • Fang, Y. ( Anhui Institute of Optics and Fine Mechanics, CAS (China) )
  • Zhang, C. ( Anhui Institute of Optics and Fine Mechanics, CAS (China) )
  • Wang, X. ( Anhui Institute of Optics and Fine Mechanics, CAS (China) )
  • Yang, B. ( Anhui Institute of Optics and Fine Mechanics, CAS (China) )
Publication title:
Optical technologies for atmospheric, ocean, and environmental studies : 18-22 October 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5832
Pub. Year:
2005
Page(from):
678
Page(to):
686
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458261 [0819458260]
Language:
English
Call no.:
P63600/5832-2
Type:
Conference Proceedings

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