EUV spectroscopy of xenon ions created using an electron beam ion trap
- Author(s):
Fahy, K. ( Univ. College Dublin (Ireland) ) Sokell, E. ( Univ. College Dublin (Ireland) ) O'Sullivan, G. ( Univ. College Dublin (Ireland) ) Cummings, A. ( Univ. College Dublin (Ireland) ) Aguilar, A. ( National Institute of Standards and Technology (USA) ) Gillaspy, J. D. ( National Institute of Standards and Technology (USA) ) Pomeroy, J. M. ( National Institute of Standards and Technology (USA) ) Tan, J. N. ( National Institute of Standards and Technology (USA) ) - Publication title:
- Opto-Ireland 2005: Optical Sensing and Spectroscopy
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5826
- Pub. Year:
- 2005
- Page(from):
- 351
- Page(to):
- 362
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458117 [0819458112]
- Language:
- English
- Call no.:
- P63600/5826
- Type:
- Conference Proceedings
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