Blank Cover Image

Interpolation artefact reduction by statistical approach in mutual information-based image registration

Author(s):
  • Su, H. ( Queen's Univ. Belfast (United Kingdom) )
  • Miller, P. C. ( Queen's Univ. Belfast (United Kingdom) )
  • Murtagh, F. ( Univ. of London (United Kingdom) )
Publication title:
Opto-Ireland 2005: Imaging and Vision
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5823
Pub. Year:
2005
Page(from):
200
Page(to):
208
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458087 [0819458082]
Language:
English
Call no.:
P63600/5823
Type:
Conference Proceedings

Similar Items:

F. Deng, S. Li, G. Su

SPIE - The International Society of Optical Engineering

X. Fan, H. Rhody, E. Saber

Society of Photo-optical Instrumentation Engineers

Chen,H., Varshney,P.K.

SPIE-The International Society for Optical Engineering

Chen, H.-M., Lin, T.-H., Hsieh, C.-Y.

SPIE - The International Society of Optical Engineering

Wei, M., Liu, J.

SPIE - The International Society of Optical Engineering

Rodriguez-Carranza,C.E., Loew,M.H.

SPIE-The International Society for Optical Engineering

Castro-Pareja, C. R., Shekhar, R.

SPIE - The International Society of Optical Engineering

Rodriguez-Carranza,C.E., Loew,M.H.

SPIE - The International Society for Optical Engineering

Q. Li, H. Ji

SPIE - The International Society of Optical Engineering

Sun, Z., Ray, L. A.

SPIE - The International Society of Optical Engineering

J. Zhao, H. Yang, Y. Ding

Society of Photo-optical Instrumentation Engineers

R. Fransens, C. Strecha, L. Van Gool

ESA Publications Division

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12