Scanning altimetric lidar (SALLl): an efficient planetary altimetric mapping instrument
- Author(s):
- Giliett, R. ( MDA Space Missions (Canada) )
- Cheng, A. ( Johns Hopkins Univ. (USA) )
- Bussey, B. ( Johns Hopkins Univ. (USA) )
- Martin, E. ( Optech Inc. (Canada) )
- Ulitsky, A. ( Optech Inc. (Canada) )
- Publication title:
- Spaceborne sensors II : 28-29 March 2005, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5798
- Pub. Year:
- 2005
- Page(from):
- 66
- Page(to):
- 72
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457837 [0819457833]
- Language:
- English
- Call no.:
- P63600/5798
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
I-SIL: features and capabilities of a long-range shuttle inspection characteristics lidar
SPIE - The International Society of Optical Engineering |
ESA Publications Division |
2
Conference Proceedings
LAPS: the development of a scanning lidar system with GNC for autonomous hazard avoidance and precision landing
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Full-scale testing and platform stabilization of a scanning lidar system for planetary landing
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
Multiple Instrument Distributed Aperture Sensor(MIDAS) for planetary remote sensing
SPIE - The International Society of Optical Engineering |
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
11
Conference Proceedings
Scanning lidar measurements of marine aerosol fields at a coastal site in Hawaii
SPIE-The International Society for Optical Engineering |
ESA Publications Division |
12
Conference Proceedings
Surface Potential Mapping Of Patterned Self-Assembled Monolayers by Scanning Probe Microscopy
Materials Research Society |