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64O×480 pixel uncooled infrared FPA with SOI diode detectors

Author(s):
Ueno, M. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Kosasayama, Y. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Sugino, T. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Nakaki, Y. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Fujii, Y. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Inoue, H. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Kama, K. ( Kamakura Works, Mitsubishi Electric Corp. (Japan) )
Seto, T. ( Kamakura Works, Mitsubishi Electric Corp. (Japan) )
Takeda, M. ( Advanced Technology R&D Ctr., Mitsubishi Electric Corp. (Japan) )
Kimata, M. ( Ritsumeikan Univ. (Japan) )
5 more
Publication title:
Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5783
Pub. Year:
2005
Page(from):
566
Page(to):
577
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457684 [081945768X]
Language:
English
Call no.:
P63600/5783-2
Type:
Conference Proceedings

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