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Robust face detection using discriminating feature analysis and Bayes classifier

Author(s):
Liu, C. ( New Jersey Institute of Technology (USA) )  
Publication title:
Biometric technology for human identification II : 28-29 March, 2005, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5779
Pub. Year:
2005
Page(from):
164
Page(to):
172
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457646 [0819457647]
Language:
English
Call no.:
P63600/5779
Type:
Conference Proceedings

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