Blank Cover Image

Temperature measurements by laser beam deflection

Author(s):
  • Martinez, P. G. ( Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico) )
  • Bante, J. ( Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico) )
  • Alvarado-Gil, J. J. ( Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico) )
Publication title:
Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5776
Pub. Year:
2005
Page(from):
804
Page(to):
811
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457578 [0819457574]
Language:
English
Call no.:
P63600/5776
Type:
Conference Proceedings

Similar Items:

J. Bante-Guerra, M. Conde, V. Tiesler, P. Quintana, J. J. Alvarado-Gil

SPIE - The International Society of Optical Engineering

P. Florian, G. G. Titus

SPIE - The International Society of Optical Engineering

Bante, J., Murray, C., Alvarado-Gil, J. J.

SPIE - The International Society of Optical Engineering

W.J. Herr, W.G. Johnson

Society of Photo-optical Instrumentation Engineers

J. Diaci, J. Možina

Society of Photo-optical Instrumentation Engineers

Gerstner,K., Fehl,A., Otten,J., Neidhardt,D., Tschudi,T.T.

SPIE-The International Society for Optical Engineering

Conde-Contreras, M., Tiessler, V., Cucina, A., Quintana, P., Alvarado-Gil, J. J.

SPIE - The International Society of Optical Engineering

Gomez-Martinez, O., Zambrano-Arjona, M., Alvarado-Gil, J.J.

Materials Research Society

Martinez,C., Belanger,P.-A.

SPIE-The International Society for Optical Engineering

Gomez-Martinez, Octavio, Aguilar, Daniel H., Alvarado-Gil, Juan J., Quintana, Patricia, Aldana-Aranda, Dalila

Materials Research Society

Wang, D.-Y., Stiller, G.P., von Clarmann, T., Garcia-Comas, M., Lopez-Puertas, M., Kiefer, M.W., Hoepfner, M., Glatthor, …

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12