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Residual stress measurement using indentation and a radial in-plane ESPI interferometer

Author(s):
Publication title:
Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5776
Pub. Year:
2005
Page(from):
735
Page(to):
745
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457578 [0819457574]
Language:
English
Call no.:
P63600/5776
Type:
Conference Proceedings

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