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Algorithm for high-accuracy particle image position estimation in PIV applications

Author(s):
Publication title:
Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5776
Pub. date:
2005
Page(from):
163
Page(to):
167
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457578 [0819457574]
Language:
English
Call no.:
P63600/5776
Type:
Conference Proceedings

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