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Analysis of the tunnel junction current

Author(s):
  • Guo, R. ( Xidian Univ. (China) )
  • Zhao, Z. ( Xidian Univ. (China) )
  • Lu, M. ( Hebei Semiconductor Research Institute (China) )
Publication title:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5774
Pub. date:
2004
Page(from):
551
Page(to):
554
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457554 [0819457558]
Language:
English
Call no.:
P63600/5774
Type:
Conference Proceedings

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