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Testing the analog processor of a structural neural system

Author(s):
Kirikera, G. R. ( Univ. of Cincinnati(USA) )
Kang, I. ( Univ. of Cincinnati(USA) )
Lee, J. W. ( Korea Institute of Machinery and Materials(South Korea) )
Shinde, V. ( Univ. of Cincinnati(USA) )
Westheider, B. ( Univ. of Cincinnati(USA) )
Shanov, V. N. ( Univ. of Cincinnati(USA) )
Schulz, M. J. ( Univ. of Cincinnati(USA) )
Sundaresan, M. ( North Carolina A&T State Univ. (USA) )
Ghoshal, A. ( United Technologies Research Ctr. (USA) )
4 more
Publication title:
Smart structures and materials 2005 : Smart electronics, MEMS, BioMEMS, and nanotechnology : 7-10 March 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5763
Pub. Year:
2005
Page(from):
356
Page(to):
367
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457448 [0819457442]
Language:
English
Call no.:
P63600/5763
Type:
Conference Proceedings

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