Blank Cover Image

Optical extensions integration for a 0.314-μm2 45-nm node 6-transistor SRAM cell

Author(s):
Publication title:
Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5756
Pub. date:
2005
Page(from):
120
Page(to):
130
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457363 [0819457361]
Language:
English
Call no.:
P63600/5756
Type:
Conference Proceedings

Similar Items:

Hendrickx, E., Monnoyer, P., Van Look, L., Vandenberghe, G.

SPIE - The International Society of Optical Engineering

Park, J., Hsu, S., Van Den Broeke, D., Chen, J. F., Dusa, M., Socha, R., Finders, J., Vleeming, B., van Oosten, A., …

SPIE - The International Society of Optical Engineering

A. Nackaerts, S. Verhaegen, M. Dusa, H. Kattouw, F. van Bilsen, S. Biesemans, G. Vandenberghe

SPIE - The International Society of Optical Engineering

Jonckheere,R.M., Vandenberghe,G.N., Wiaux,V., Verhaegen,S., Ronse,K.

SPIE-The International Society for Optical Engineering

S. Verhaegen, S. Cosemans, M. Dusa, P. Marchal, A. Nackaerts

Society of Photo-optical Instrumentation Engineers

G. E. Bailey, A. Tritchkov, J. Park, L. Hong, V. Wiaux, E. Hendrickx, S. Verhaegen, P. Xie, J. Versluijs

SPIE - The International Society of Optical Engineering

Lee, K., Yang, J. -H., Maeda, S., Jin, Y.- S., Choi, J. -A., Bae, S. -G., Kim, Y. -H., Ahn, J. -H., Sun, M. -C., Ku, J. …

Electrochemical Society

S. Mimotogi, F. Uesawa, M. Tominaga, H. Fujise, K. Sho, M. Katsumata, H. Hane, A. Ikegami, S. Nagahara, T. Ema, M. …

SPIE - The International Society of Optical Engineering

M. Drapeau, V. Wiaux, E. Hendrickx, S. Verhaegen, T. Machida

SPIE - The International Society of Optical Engineering

Verhaegen, S., Nackaerts, A., Dusa, M., Carpaij, R., Vandenberghe, G., Finders, J.

SPIE - The International Society of Optical Engineering

Yuito, T., Wiaux, V., Look, L. Van, Vandenberghe, G., Irie, S., Matsuo, T., Misaka, A., Watanabe, H., Sasago, M.

SPIE - The International Society of Optical Engineering

Driessen, F.A., Zawadzki, M.T., Krishnan, P.R., Balasinski, A., Vandenberghe, G.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12