Lithography manufacturing implementation for 65 nm and 45 nm nodes with model-based scattering bars using IML technology
- Author(s):
- Nam, D. ( Samsung Electronics Co. (South Korea) )
- Milster, T. D. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
- Chen, T. ( Optical Sciences Ctr./Univ. of Arizona (USA) )
- Publication title:
- Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5754
- Pub. Year:
- 2005
- Pt.:
- 1
- Page(from):
- 355
- Page(to):
- 367
- Pages:
- 13
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457349 [0819457345]
- Language:
- English
- Call no.:
- P63600/5754
- Type:
- Conference Proceedings
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