Nanomolecular resists with adamantane core for 193-nm lithography
- Author(s):
Kim, S.-K. ( Hanyang Univ. (South Korea) ) An, I. ( Hanyang Univ. (South Korea) ) Oh, H.-K. ( Hanyang Univ. (South Korea) ) Lee, S. M. ( Seoul National Univ. (Soufh Korea) ) Bok, C. K. ( Hynix Semiconducfor Inc. (South Korea) ) Moon, S. C. ( Hynix Semiconducfor Inc. (South Korea) ) - Publication title:
- Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5753(1)
- Pub. Year:
- 2005
- Pt.:
- 1
- Page(from):
- 603
- Page(to):
- 610
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457332 [0819457337]
- Language:
- English
- Call no.:
- P63600/5753-1
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Synthesis of fluorinated materials for 193-nm immersion lithography and 157-nm lithography
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Ring opened maleic anhydride and norbornene copolymers (ROMA) have a good character in resist flow process for 193-nm resist technology
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Cycloolefin copolymer containing hindered hydroxyl group for 1 93nm photoresist
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
PEB sensitivity variation of 193-nm resist according to activation energy of protection groups
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
High-performance 193-nm photoresist materials based on ROMA polymers: sub-90-nm contact hole application with resist reflow
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Water-developable resists based on glyceryl methacrylate for 193-nm lithography
SPIE - The International Society of Optical Engineering |