Blank Cover Image

X-ray dark-field imaging and potential of its clinical application

Author(s):
Shimao, D. ( Graduate Univ. of Advanced Studies (Japan) )
Sugiyama, H. ( Graduate Univ. of Advanced Studies (Japan) and Photon Factory, KEK (Japan) )
Kunisada, T. ( Okayama Univ. (Japan) )
Maksimenko, A. ( Photon Factory, KEK (Japan) )
Toyofuku, F. ( Kyushu Univ. (Japan) )
Ueno, E. ( Univ. of Tsukuba (Japan) )
Yamasaki, K. ( Spring-8, JASRI (Japan) and Kobe Univ. (Japan) )
Obayashi, C. ( Kobe Univ. (Japan) )
Hyodo, K. ( Photon Factory, KEK (Japan) )
Li, G. ( Beijing Synchrotron Radiation Facility, IHEP (China) )
Pan, L. ( China-Japan Friendship Hospital (China) )
Jiang, X. ( Beijing Synchrotron Radiation Facility, IHEP (China) )
Ando, M. ( Graduate Univ. of Advanced Studies (Japan) and Photon Factory, KEK (Japan) )
8 more
Publication title:
Medical Imaging 2005: Physics of Medical Imaging
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5745
Pub. date:
2005
Page(from):
32
Page(to):
39
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819457196 [0819457191]
Language:
English
Call no.:
P63600/5745-1
Type:
Conference Proceedings

Similar Items:

Hashimoto, E, Maksimenko, A, Sugiyama, H, Hyodo, K, Shimao, D, Yuasa, T, Nishino, Y, Ishikawa, T, Mori, K, Arai, Y, …

SPIE - The International Society of Optical Engineering

Dilmanian,F.A., Wu,X.Y., Ren,B., Button,T.M., Chapman,L.D., Dobbs,J.M., Huang,X., Nickoloff,E.L., Parsons,E.C.,Jr., …

SPIE-The International Society for Optical Engineering

Uyama,C., Tokumori,K., Toyofuku,F., Sugiyama,H., Hyodo,K., Ando,M., Nishimura,K., Takeda,T., Yamasaki,K., Matsumoto,M.

SPIE - The International Society for Optical Engineering

Li, G., Hirano, K., Jiang, X., Chen, Z., Wu, Z., Ando, M., Pan, L., Tang, J., Zhu, P., Ning, R.

SPIE - The International Society of Optical Engineering

Toyofuku,F., Tokumori,K., Kanda,S., Higashida,Y., Ohki,M., Cho,T., Nishimura,K., Hyodo,K., Ando,M., Uyama,C.

SPIE - The International Society for Optical Engineering

Yin, -C. G., Duewer, F., Zeng, X., Lyon, A., Yun, W., Chen, -R. F., Liang, S. K.

SPIE - The International Society of Optical Engineering

Nakajima,Y., Sato,E., Tanioka,K., Kawai,T., Tanaka,E., Kobayashi,W., Yamamoto,Y., Fujii,M., Shinozaki,Y., Kan,Y., …

SPIE-The International Society for Optical Engineering

Okamoto,M., Ando,T., Yamasaki,K., Shimizu,E.

SPIE - The International Society for Optical Engineering

Maksimenko, A., Hashimoto, E., Ando M, Sugiyama H, Yuasa T

SPIE - The International Society of Optical Engineering

Takeda,T., Zeniya,T., Wu,J., Yu,Q., Lwin,T.-T., Tsuchiya,Y., Rao,D.V., Yuasa,T., Yashiro,T., Dilmanian,F.A., Itai,Y., …

SPIE-The International Society for Optical Engineering

Tokumori,K., Toyofuku,F., Kanda,S., Baba,S., Mito,Y., Hyodo,K., Ando,M., Uyama,C.

SPIE - The International Society for Optical Engineering

Schatzki,T.F., Haff,R.P., Young,R., Can,I., Le,L.C., Toyofuku,N.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12