Junction temperature in light-emitting diodes assessed by different methods
- Author(s):
Chhajed, S. ( Rensselaer Polytechnic Institute (USA) ) Xi, Y. ( Rensselaer Polytechnic Institute (USA) ) Gessmann, Th. ( Rensselaer Polytechnic Institute (USA) ) Xi, J.-Q. ( Rensselaer Polytechnic Institute (USA) ) Shah, J.M. ( Rensselaer Polytechnic Institute (USA) ) Kim, J.K. ( Rensselaer Polytechnic Institute (USA) ) Schubert, E.F. ( Rensselaer Polytechnic Institute (USA) ) - Publication title:
- Light-Emitting Diodes: Research, Manufacturing, and Applications IX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5739
- Pub. Year:
- 2005
- Page(from):
- 16
- Page(to):
- 24
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819457134 [0819457132]
- Language:
- English
- Call no.:
- P63600/5739
- Type:
- Conference Proceedings
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