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Junction temperature in light-emitting diodes assessed by different methods

Author(s):
Chhajed, S. ( Rensselaer Polytechnic Institute (USA) )
Xi, Y. ( Rensselaer Polytechnic Institute (USA) )
Gessmann, Th. ( Rensselaer Polytechnic Institute (USA) )
Xi, J.-Q. ( Rensselaer Polytechnic Institute (USA) )
Shah, J.M. ( Rensselaer Polytechnic Institute (USA) )
Kim, J.K. ( Rensselaer Polytechnic Institute (USA) )
Schubert, E.F. ( Rensselaer Polytechnic Institute (USA) )
2 more
Publication title:
Light-Emitting Diodes: Research, Manufacturing, and Applications IX
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5739
Pub. Year:
2005
Page(from):
16
Page(to):
24
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457134 [0819457132]
Language:
English
Call no.:
P63600/5739
Type:
Conference Proceedings

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