Advanced process and device modeling of full-frame CCD imagers (Invited Paper)
- Author(s):
- Wordelman, C.J. ( Synopsys Corp. (USA) )
- Banghart, E.K. ( Eastman Kodak Co. (USA) )
- Publication title:
- Physics and Simulation of Optoelectronic Devices XIII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5722
- Pub. Year:
- 2005
- Page(from):
- 501
- Page(to):
- 515
- Pages:
- 15
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456960 [0819456969]
- Language:
- English
- Call no.:
- P63600/5722
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
MRS - Materials Research Society |
2
Conference Proceedings
31 Mp and 39 Mp full-frame CCD image sensors with improved charge capacity and angle response [6069-02]
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Six-million-pixel full-frame true 2-ヲオ CCD image sensor incorporating transparent gate technology and optional antiblooming protection
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
DEVICE DEGRATION ON A FULL-FRAME CCD IMAGE SENSORWITH A TRANSPARENT GATE ELECTRODE
Materials Research Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
PN-CCD camera for XMM: performance of full frame and window operating modes
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Joint temporal-spatial quality enhancement for full frame-rate video playback
SPIE-The International Society for Optical Engineering |